Testing capability indices for one-sided processes with measurement errors

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Testing capability indices for one-sided processes with measurement errors

In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices C p (u, v) and C l p(u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. This assumption insufficiently reflects real situations even when advanced measuring instruments are used. In this paper...

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Testing capability indices for manufacturing processes with asymmetric tolerance limits and measurement errors

Most research works related to process capability indices assume no gauge measurement errors. However, such an assumption inadequately reflects real situations even when advanced measuring instruments are employed. If we do not take into account these errors, conclusions drawn from process capability are therefore unreliable. In this paper we study the sampling distribution of capability indice...

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One-sided Process Capability Assessment in the Presence of Measurement Errors

In the manufacturing industry, many product characteristics are of one-sided specifications. The well-known process capability indices CPU and CPL are often used to measure process performance. Most capability research works have assumed no measurement errors. Unfortunately, such an assumption is not realistic even if the measurement is conducted using highly sophisticated advanced measuring in...

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One-sided Process Capability Assessment in the Presence of Gauge Measurement Errors

Montgomery [31] recommended some minimum quality requirements on . For existing processes, the capability must be no less than 1.25, and for new processes, the capability must be no less than 1.45. For existing processes on safety, strength, or critical parameters, the capability must be no less than 1.45, and for new processes on safety, strength, or critical parameters, the capability must be...

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Process Capability Analysis with Focus on Indices for One- sided Specification Limits

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ژورنال

عنوان ژورنال: International Journal of Metrology and Quality Engineering

سال: 2013

ISSN: 2107-6839,2107-6847

DOI: 10.1051/ijmqe/2013049